IEESD 2018-11-26T14:06:22+00:00

IEESD 2019: The 9th IEEE International Workshop on Industrial Experience in Embedded Systems Design

Call for Papers

Industrial systems are more and more changed to more complex, smart and autonomous systems of systems. Although differently sized we can see a shift towards increased computational power to solve the smart part of the tasks and act autonomously. The integration of such systems into a complex system-of-systems, the smart, autonomous and at the same time safe interaction of these systems with their environment as well as with other autonomous systems are important questions in the design and development of large industrial systems.

Current high end computing platforms enable more functionality to be placed in an autonomous embedded system. In addition, connectivity is enabled by different and very affordable communication modules. Thus, more and more embedded systems are counted among systems in the smart internet-of-things domain. Such systems gather and deliver many different data elements which in the end are forming a huge data stream and enable smart analyses and smart decisions.

The additional complexity of industrial systems composed of the above mentioned smaller modules is a new challenge in the Industry 4.0 arena. Adapted software development methods/processes with their technologies and accompanying tools need to be analyzed. In addition, the models of such systems, on a higher structural level, need to be adapted and further developed as well. Especially their integration towards simulation models for a complete system test are needed to predict any errors early in the development cycle.

The theme of this workshop is to continuously gather current requirements of autonomous technical systems which are highly interrelated through defined interfaces and embedded in a complex environment. We need to analyze the autonomous requirements, their implementation and their possible abstractions towards early and accurate simulation models.

Different beneficial approaches for assessing and modeling such complex embedded systems are needed and will foster the application and further development of scientific approaches in the domain of autonomous / smart systems and interrelated technical systems.

Scope of the Workshop

Papers are expected to cover (non-restrictively) one or more of the following topics:

  • Adaptable, evolvable software and hardware architectures, execution models and runtime platforms
  • Smart system of systems
  • Artificial Intelligence in industrial systems
  • Experience reports with smart embedded technical systems out of different domains
  • Model-driven development for smart embedded systems
  • Product lines architectures, software architectures for complex embedded systems
  • Testing of complex embedded systems and system of systems
  • Evaluation and analysis of software architectures
  • Development methods, processes and tools for complex embedded systems
  • Coupling of devices and enterprise applications


Paper Submission Site


Submission deadlines are given on the Important Dates page.

Paper templates and additional information for authors is available on the Information for Authors page.

All papers submitted to symposia and workshops must be original, previously unpublished work. Interested in presenting previously IEEE journal published work at COMPSAC? Please see our page on Journal First/Conference Second (J1C2) publishing opportunities!

IEESD Organizers

Detlef Streitferdt, Technische Universitat Ilmenau, Germany
Email: detlef.streitferdt@tu-ilmenau.de

Tiberiu Seceleanu, ABB Corporate Research, Sweden
Email: tiberiu.seceleanu@se.abb.com

Philipp Nenninger, University of Applied Sciences Karlsruhe, Germany
Eail: philipp.nenninger@hs-karlsruhe.de

Program Committee

Tughrul Arslan, University of Edinburgh, UK
Jerker Delsing, Lulea University of Technology, Sweden
Robert Eschbach, ITK Engineering, Germany
Manal A. Farrag, Prince Sultan University, Saudi Arabia
Mikael Gidlund, ABB CRC, Sweden
Stamatis Karnouskos, SAP, Germany
Stephan Pietsch, TestingTech, Germany
Ghulam Rasool, CIIT Lahore, Pakistan
Felix Beier, Technische Universität Ilmenau
Khalid Ebanhesaten, Metro Systems GmbH
Cristina Seceleanu, Malardalen University, Sweden
Dragos Truscan, Abo Akademi, Finland