IEESD 2018-07-20T13:09:27+00:00

IEESD: The 8th IEEE International Workshop on Industrial Experience in Embedded Design

Call for Papers

Industrial systems are more and more changed to more complex, smart and autonomous systems of systems. Although differently sized we can see a shift towards increased computational power to solve the smart part of the tasks and act autonomously. The integration of such systems into a complex system-of-systems, the smart, autonomous and at the same time safe interaction of these systems with their environment as well as with other autonomous systems are important questions in the design and development of large industrial systems.

Current high end computing platforms enable more functionality to be placed in an autonomous embedded system. In addition, connectivity is enabled by different and very affordable communication modules. Thus, more and more embedded systems are counted among systems in the smart internet-of-things domain. Such systems gather and deliver many different data elements which in the end are forming a huge data stream and enable smart analyses and smart decisions.

The additional complexity of industrial systems composed of the above mentioned smaller modules is a new challenge in the Industry 4.0 arena. Adapted software development methods/processes with their technologies and accompanying tools need to be analyzed. In addition, the models of such systems, on a higher structural level, need to be adapted and further developed as well. Especially their integration towards simulation models for a complete system test are needed to predict any errors early in the development cycle.

The theme of this workshop is to continuously gather current requirements of autonomous technical systems which are highly interrelated through defined interfaces and embedded in a complex environment. We need to analyze the autonomous requirements, their implementation and their possible abstractions towards early and accurate simulation models.

Different beneficial approaches for assessing and modeling such complex embedded systems are needed and will foster the application and further development of scientific approaches in the domain of autonomous and interrelated technical systems.

Scope of the Workshop

Papers are expected to cover (non-restrictively) one or more of the following topics:

  • Adaptable, Evolvable Software and Hardware Architectures, Execution Models and Runtime Platforms
  • Security of a system of systems as well as each module (e.g. blockchain technology in the industry)
  • Artificial Intelligence in industrial systems
  • Experience reports with autonomous embedded technical systems out of different domains and for different platforms
  • Model-Driven Development for autonomous embedded systems
  • Product Lines Architectures, Software Architectures for complex embedded systems
  • Testing of complex embedded Systems and System of Systems
  • Evaluation and Analysis of Software Architectures
  • Development Methods, Processes and Tools for complex embedded Systems
  • (heterogeneous) Networking Environments
  • Coupling of Devices and Enterprise Applications

IEESD Program Schedule

Friday July 27, 11:30 – 1:00pm
Location: Meeting 203
Session Chair: Detlef Streitferdt, Ilmenau University of Technology, Germany

Increasing Efficiency in Data Flow Oriented Model Driven Software Development for Softcore Processors
Michael Kirchhoff, Jörn Weisensee, Detlef Streitferdt, Wolfgang Fengler, Elena Rozova

State Estimation Using Neural Networks in Industrial Processes
Philipp Nenninger, Nils Bieler

Traceability in Systems Engineering: An Avionics Case Study
Nasser Mustafa, Yvan Labiche, Dave Towey

IEESD Workshop Organizers

Detlef Streitferdt, Technische Universitat Ilmenau, Germany

Tiberiu Seceleanu, ABB Corporate Research, Sweden

Philipp Nenninger, University of Applied Sciences Karlsruhe, Germany

IEESD Program Committee

Tughrul Arslan, University of Edinburgh, UK

Manal A. Farrag, Prince Sultan University, Saudi Arabia

Mikael Gidlund, ABB CRC, Sweden

Stamatis Karnouskos, SAP, Germany

Stephan Pietsch, TestingTech, Germany

Ghulam Rasool, CIIT Lahore, Pakistan

Felix Beier, Technische Universität Ilmenau

Khalid Ebanhesaten, Metro Systems GmbH

Cristina Seceleanu, Malardalen University, Sweden

Dragos Truscan, Abo Akdemi, Finland