The 16th IEEE International Workshop on Software Test Automation (STA 2024)

Goal of the workshop:

Test automation aims to reduce the cost and improve the effectiveness of software testing by using various techniques and methods. Other benefits are consistency and accuracy, reduction of overall test cycle time, risk mitigation of manual testing, and increase in overall product quality. Recording test activities as test scripts and playing the test scripts or record and playback are the common methods. More advanced methodologies include data-driven, keyword-driven and hybrid methods as well as framework-based methods. Among tool development, interoperability remains a major challenge.

Workshop theme:

To thrive in this increasingly uncertain world, innovations of computer hardware, software, and applications have emerged as a pressing need. The emerging interconnected world demands new developments in sensor-based communication hardware and operating systems. Software engineering continues to prove essential to our daily lives ranging from financial services, health care, remote learning platforms, social networks to the era of connected and autonomous vehicles, and artificial intelligence control. Governing organizations have responded to this trend by defining regulations and standards to address issues such as safety, security, and resiliency of computer hardware and software systems and applications. However, unique challenges originate from mandating these requirements under uncertainty in the absence of sound and complete solutions applicable to these new types of systems and applications. As computer researchers, we see these challenges as opportunities to fill gaps in how all dimensions of computing are developed, utilized, and supported. How to improve the resiliency of these components across a wide range of use domains is a significant challenge we suddenly find ourselves facing. How do we design systems that are able to withstand the stress of global-scale use, and still provide robust and secure services to end-users? Accordingly, submissions including applications and case studies in these areas will highly be appreciated.

Scope of the workshop:

Topics of interest include, but are not limited to, the following:

  • Test automation for large, complex systems
  • Performance, Regression, Reliability testing, Mean Time between Failures (MTBF)
  • Testing in Continuous Integration / Continuous Development (CI/CD) pipeline and DevOps.
  • Early defect detection, exploratory testing, reducing development timeline
  • Test-driven development and behavior driven testing
  • Open Source
  • Test modeling and test methodologies
  • Model Based Testing, Keyword Based Testing, Combinatorial testing, Test input generation
  • Test-driven development and behavior driven testing
  • Application in different domains – digital world, cloud computing, HPC, healthcare
  • Experiments, empirical studies, experience reports, and case studies.
  • Design of high-quality, reusable tests, test reuse, libraries, Product Line Testing
  • Support for testing methods, test framework, test infrastructure.
  • Management of distributed test assets and test environments
  • Development, operation, integration, and standardization of test tools
  • Test metrics to measure test efficiency and test coverage optimization
  • Test efficiency, Test effectiveness, and Lean testing approaches.
  • Quantitative studies including cost vs. benefit studies.

Paper Templates

IEEE Paper templates are available in MS Word 2003 and LaTex. All submissions must use US 8.5×11 letter page format.

IEEE Conference Publishing Policies

All submissions must adhere to IEEE Conference Publishing Policies.

IEEE Cross Check

All submission will be screened for plagiarized material through the IEEE Cross Check portal.

Important Dates – Workshops

Workshop, Fast Abstract, SRS, JC  papers due
April 15, 2024  Extended to April 21

Notification
May 1, 2024

Camera Ready & Registration due
May 25, 2024

Workshop Organizers

Rajesh Subramanyan, Amazon, USA
Email: subramanr19[at]gmail.com

Emeritus
Fevzi Belli, University of Paderborn
Email: belli[at]upb.de

T.H. Tse, University of Hong Kong

Program Committee

Xiaoying Bai, Tsinghua University, China

Christof Budnik, Siemens, USA

Arilo Claudio, Federal University of Amazonas, Brazil

Atilla Elci, Hasan Kalyoncu University,

Jerry Gao, San Jose State University, USA

Ron Kenett, KPA Ltd, Israel

Yvan Labiche, Carleton University, Canada

Juncao Li, DoorDash, USA

Aditya Mathur, Purdue University, USA

Ina Schieferdecker, Fraunhofer FOKUS, Germany

Marek Stochel, Motorola Solutions, Poland

Guilherme Travassos, Federal University of Rio de Janerio (COPPE/UFRJ), Brazil

Dragos Truscan, Ãbo Akademi University, Finland

Tugkan Tuglular, Izmir University, Turkey

Mario Winter, Univ. of Applied Science, Cologne, Germany

Dave Towey, The University of Nottingham, Ningbo, China

Fie Xie, Portland State University, USA

Hong Zhu, Oxford Brookes University, UK