Journal/Conference
Conference/Journal (JC/CJ)
The JC (Journal/Conference) program. Authors of papers published in a peer-reviewed journal (or accepted for publication) can present their plans for ongoing research based on the work described in that paper at this year’s COMPSAC. Authors must submit their published article (or its DOI) and a two-page description of their planned extension to the content of that paper. Use the JC process if you are a previous author and wish to seek comments and suggestions from conference attendees regarding your planned research extensions.
The CJ (Conference/Journal) program. This program was developed as a bonus for selected papers presented at this year’s COMPSAC. Conference organizers will select articles they believe worthy of publication in an IEEE journal. The selections will be forwarded to appropriate IEEE journal editors-in-chief (EIC), requesting that they consider the paper(s) for inclusion in their publication. Papers undergoing this process will not be included in the conference proceedings unless the journal rejects them. At that time, they will be retroactively included in the already-published proceedings. If the journal accepts them, a note will be inserted in the archived proceeding pointing to the journals as the locations of the published papers
JC/CJ Program Chairs
Stelvio Cimato
University of Milan
Henry Chan
The Hong Kong Polytechnic University
Dave Towey
University of Nottingham at Ningbo China
Key Workshop & Special Session Dates
Workshop & special session papers due:
Extended: 22 April 2026 15 April 2026
Workshop & special session papers notification:
7 May 2026
Camera Ready Paper submission:
21 May 2026
Paper Templates
IEEE Paper templates are available in MS Word, LaTex, and Overleaf. All submissions must use US 8.5×11 letter page format.
IEEE Conference Publishing Policies
All submissions must adhere to IEEE Conference Publishing Policies.
Open Access Option
Authors may choose to publish their accepted papers as open access. For details, please refer to the Author Information page.
IEEE Cross Check
All submission will be screened for plagiarized material through the IEEE Cross Check portal.