COMPSAC 2025 Symposium on Computer Architecture & Platforms (CAP)
The Computer Architecture & Platforms Symposium (CAP) aims at bringing together researchers and practitioners that study and build computer systems consisting of disparate components, using different metrics and methods, but providing synergetic effects. These systems usually act as reusable supporting platforms for a wide range of applications, potentially restricted by specific domains.
CAP is uniquely positioned within COMPSAC to address relevant topics related to the conception, design, deployment and utilization of a variety of architectures and platforms – from mobile to networked data centers. Non-limiting topics include:
- requirements analysis
- co-analysis, co-design and co-verification
- modeling, design, development, testing, measurement, verification and validation for function, performance, safety, security, and dependability constraints of cyber-physical systems and networked systems.
The effective construction of computing systems is not restricted solely to the field of computer science and engineering, but it is truly a multidisciplinary effort. Multidisciplinary work, research and development of software prototypes, industry-university collaborations, all based on emerging and critical concepts and technologies are of particular interest to this symposium
CAP Symposium Chairs
Yasutaka Wada, Meisei University
Email: yasutaka.wada@meisei-u.ac.jp
Cristina Seceleanu, Malärdalen University
Email: cristina.seceleanu@mdh.se
Important Dates – Symposia
UPDATED: Full papers due: January 31st, February 15, February 28, 2025
Paper notification: April 7th, 2025
Camera ready copy: June 1st, 2025
Conference: July 8-11, 1015
Camera ready copy: June 1st, 2025
Conference: July 8-11, 1015
Paper Templates
IEEE Paper templates are available in MS Word 2003 and LaTex. All submissions must use US 8.5×11 letter page format.
IEEE Conference Publishing Policies
All submissions must adhere to IEEE Conference Publishing Policies.
IEEE Cross Check
All submission will be screened for plagiarized material through the IEEE Cross Check portal.